Samsung has developed the industry's first 40-nanometer (nm) memory device. The new 32 Gigabit (Gb) NAND flash device is the first memory to incorporate a Charge Trap Flash (CTF) architecture, a new approach to further increase manufacturing efficiency while greatly improving performance.

The new CTF-based NAND flash memory increases the reliability of the memory by sharply reducing inter-cell noise levels. It will improve manufacturing process technology from 40 nm to 30 and even 20nm. The 32Gb NAND flash memory can be used in memory cards with densities of up to 64-Gigabytes (GBs). One 64GB card can store over 64 hours of DVD resolution movies (40 movies) or 16,000 MP3 music files (1,340 hours).

The new 32Gb CTF memory was announced at the sixth annual Samsung press conference in Seoul. Introduction of a 40nm manufacturing process for 32Gb NAND flash marks the seventh generation of NAND flash that follows the New Memory Growth Theory of double-density growth every 12 months, which was first presented by Dr. Chang Gyu Hwang, president and CEO of Samsung Electronics' Semiconductor Business in a keynote address at ISSCC 2002.